Materials Science Research Lecture
Advancement of Transmission Electron Microscopy and its Application in Materials Research
Abstract: As advances in aberration-corrected transmission electron microscopy (TEM) have enabled the determination of the three-dimensional structure and local electronic properties of nanostructures with the sub-angstrom resolution, the recent development of in situ TEM techniques allows one to study the structure, chemical composition, and electronic properties of materials at the atomic cale and to follow the dynamic evolution of nanoastructured materials in response to applied fields and to changes in environments. In this talk, I will give a brief review of the advancement of electron microscopy and demonstrate the unique capabilities of the state-of-the-art aberration-corrected TEM and in situ microscopy with our recent studies on different nanostructured materials, including the nucleation and growth of ferroelectric domains during switching under applied electrical field or mechanical stress, oxidation/reduction of self-regenerating catalysts within a gas-reaction cell in TEM, and structural evolution of lithium-ion battery materials.
Refreshments served at 3:30pm in the Spalding Laboratory Lobby.
Contact: Jennifer Blankenship at 626-395-8124 firstname.lastname@example.org